Label-free deeply subwavelength optical microscopy-Reference-Cited by-同舟云学术

Label-free deeply subwavelength optical microscopy

Published:2020-03-30 Issue:13 Volume:116 Page:131105
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Pu T.¹,Ou J. Y.¹^ORCID,Papasimakis N.¹^ORCID,Zheludev N. I.¹²^ORCID

Affiliation:

1. Optoelectronics Research Centre and Centre for Photonic Metamaterials, University of Southampton, Southampton SO17 1BJ, United Kingdom

2. Centre for Disruptive Photonic Technologies, The Photonics Institute, School of Physical and Mathematical Sciences, Nanyang Technological University, 637371 Singapore

Funder

Agency for Science, Technology and Research

Chinese Scholarship Council

Singapore Ministry of Education

Engineering and Physical Sciences Research Council

H2020 European Research Council

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/5.0003330

Reference10 articles.

1. Near-field microscopy by elastic light scattering from a tip

2. Fluorescent probes for super-resolution imaging in living cells

3. Deep learning enables cross-modality super-resolution in fluorescence microscopy

4. Applications, promises, and pitfalls of deep learning for fluorescence image reconstruction

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