Evaluation of microstructure and residual stress in W/B4C multilayer optics-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Evaluation of microstructure and residual stress in W/B4C multilayer optics

Published:2018-09-21 Issue:11 Volume:124 Page:115306
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Majhi A.¹²,Dilliwar M.³,Pradhan P. C.¹²^ORCID,Jena S.⁴,Nayak M.¹²^ORCID,Singh M. N.¹^ORCID,Udupa D. V.²⁴,Sahoo N. K.²⁴

Affiliation:

1. Synchrotrons Utilization Section, Raja Ramanna Centre for Advanced Technology, Indore 452013, India

2. Homi Bhabha National Institute, Training School Complex, Anushakti Nagar, Mumbai 400094, India

3. School of Studies in Electronics and Photonics, Pt. Ravishankar Shukla University, Raipur 492010, India

4. Atomic and Molecular Physics Division, Bhabha Atomic Research Centre, Mumbai 400085, India

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5050588

Reference47 articles.

1. High-energy characterization of multilayers for hard x-ray astronomy

2. Performance of Multilayer Monochromators for Hard X-Ray Imaging with Coherent Synchrotron Radiation

3. A single W/B_4C transmission multilayer for polarization analysis of soft x-rays up to 1keV

4. Reflective multilayer optic as hard X-ray diagnostic on laser-plasma experiment

5. Physics of Reflective Optics for the Soft Gamma-Ray Photon Energy Range

Cited by 15 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Interface smoothing in short-period W/B4C multilayers using neon ion beam polishing;Journal of Applied Physics;2023-12-26

2. Increasing soft x-ray reflectance of short-period W/Si multilayers using B4C diffusion barriers;Journal of Applied Physics;2023-01-09

3. Linear and non-linear optical properties of boron carbide thin films;Applied Surface Science;2023-01

4. Improvement of electrochemical deposition performance and design of Fe–Ni multilayer structure by nanosecond laser;Surfaces and Interfaces;2022-12

5. Structural characterization of Au/Cr bilayer thin films using combined X‐ray reflectivity and grazing incidence X‐ray fluorescence measurements;Surface and Interface Analysis;2022-06-17

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3