The use of ‘‘mixed’’ beams in microprobe imaging-Reference-Cited by-同舟云学术

The use of ‘‘mixed’’ beams in microprobe imaging

Published:1996-08 Issue:8 Volume:67 Page:2940-2946
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Saint A.,Breese M. B. H.,Legge G. J. F.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1147076

Reference7 articles.

1. High resolution techniques for the scanning proton microprobe

2. Microcircuit imaging using an ion‐beam‐induced charge

3. MeV ion beam lithography of PMMA

4. Scanning MeV-ion microprobe for light and heavy ions

5. Proceedings of the 6th International Conference on Accelerator Mass Spectrometry, Canberra-Sydney, Australia [Nucl. Instrum. Methods B 92, (1994)].NIMBEU0168-583X

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