The free electron gas primary thermometer using an ordinary bipolar junction transistor approaches ppm accuracy
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Published:2017-06
Issue:6
Volume:88
Page:064901
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ISSN:0034-6748
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Container-title:Review of Scientific Instruments
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language:en
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Short-container-title:Review of Scientific Instruments
Reference33 articles.
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2. Theory of Impurity Scattering in Semiconductors
3. D. L. Blackburn, in National Institute of Standards and Technology, 20th Semi-Therm Symposium (IEEE, 2004), p. 11.
Cited by
2 articles.
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