Be diffusion mechanisms in InGaAs during post‐growth annealing
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.114753
Reference16 articles.
Cited by 22 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Influence of doping level and surface states in tunneling spectroscopy of an In0.53Ga0.47As quantum well grown on p -type doped InP(001);Physical Review Materials;2019-09-20
2. Dopant–dopant interactions in beryllium doped indium gallium arsenide: An ab initio study;Journal of Materials Research;2018-01-14
3. A Model for Estimating Chemical Potentials in Ternary Semiconductor Compounds: the Case of InGaAs;MRS Advances;2017-05-15
4. Grown-in beryllium diffusion in indium gallium arsenide: An ab initio, continuum theory and kinetic Monte Carlo study;Acta Materialia;2017-02
5. A combined kick-out and dissociative diffusion mechanism of grown-in Be in InGaAs and InGaAsP. A new finite difference-Bairstow method for solution of the diffusion equations;Journal of Applied Physics;2014-09-14
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