Very high resolution soft x-ray spectrometer for an electron beam ion trap-Reference-Cited by-同舟云学术

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Very high resolution soft x-ray spectrometer for an electron beam ion trap

Published:1997-01 Issue:1 Volume:68 Page:1077-1079
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Beiersdorfer P.,Crespo López-Urrutia J. R.,Förster E.,Mahiri J.,Widmann K.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1147791

Cited by 49 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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