Sample positioner and deflection energy analyzer for measurements of photofield emission-Reference-Cited by-同舟云学术

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Sample positioner and deflection energy analyzer for measurements of photofield emission

Published:1985-06 Issue:6 Volume:56 Page:1206-1211
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Venus D.,Lee M. J. G.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1138030

Reference17 articles.

1. Field Emission Deflection Energy Analyzer

2. Analyzer system for field emission energy distribution (FEED) measurements

3. Angular Anisotropies in the Photoemission from Polycrystalline Gold

4. Analyzer system capable of determining energy and direction of charged particles in ultrahigh vacuum

5. Theory of surface effect in photoassisted field emission

Cited by 20 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Electronic structures of tungsten surfaces and total-energy distributions of the field-emission current;Physical Review B;2004-09-30

2. Surface states and resonances in field emission from low-index facets of clean tungsten;Progress in Surface Science;2001-08

3. Electronic structure of silver overlayers on W(100);Physical Review B;1996-04-15

4. Configuration and electronic structure of silver overlayers on microscopic (110) facets of tungsten;Surface Science;1995-05

5. Suppression of field emission from W(110) and W(111) by Cu overlayers;Progress in Surface Science;1995-01

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