Simplified analysis of some complex film stacks in x-ray reflectivity
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.120838
Reference6 articles.
1. Thin-film thickness and density determination from x-ray reflectivity data using a conventional power diffractometer
2. X-Ray Reflectometry of Single- and Multi-Layer Thin Films
3. Surface Studies of Solids by Total Reflection of X-Rays
4. X-ray and neutron scattering from rough surfaces
5. X-ray-scattering studies of the interfacial structure of Au/GaAs
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1. X-ray Structure Analysis of Free-Standing Lipid Membranes Facilitated by Micromachined Apertures;Langmuir;2008-03-28
2. Influence of nanocrystal growth kinetics on interface roughness in nickel–aluminum multilayers;Applied Physics Letters;2003-12-29
3. Improved Fourier method of thickness determination by x-ray reflectivity;Journal of Applied Physics;2003-02-15
4. Nondestructive characterization of thin silicides using x-ray reflectivity;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2000-03
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