Analysis of leakage current conduction phenomenon in thin SrBi2Ta2O9 films grown by excimer laser ablation
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1448396
Reference16 articles.
1. Ferroelectric Memories
2. Qualitative model for the fatigue‐free behavior of SrBi2Ta2O9
3. Polarization Fatigue Characteristics of Sol-Gel FerroelectricPb(Zr0.4Ti0.6)O3Thin-Film Capacitors
4. Fatigue and switching in ferroelectric memories: Theory and experiment
5. Characteristics of Bismuth LayeredSrBi2Ta2O9Thin-Film Capacitors and Comparison withPb(Zr,Ti)O3
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