A new device for high-temperaturein situGISAXS measurements-Reference-Cited by-同舟云学术

A new device for high-temperaturein situGISAXS measurements

Published:2018-03 Issue:3 Volume:89 Page:035103
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Fritz-Popovski Gerhard¹²^ORCID,Bodner Sabine C.¹³,Sosada-Ludwikowska Florentyna¹,Maier Günther A.¹^ORCID,Morak Roland²,Chitu Livia⁴,Bruegemann Lutz⁴^ORCID,Lange Joachim⁴,Krane Hans-Georg⁴,Paris Oskar²^ORCID

Affiliation:

1. Materials Center Leoben Forschung GmbH, Roseggerstr. 12, 8700 Leoben, Austria

2. Institute of Physics, Montanuniversität Leoben, Franz-Josef-Str. 18, 8700 Leoben, Austria

3. Department of Materials Physics, Montanuniversität Leoben and Erich Schmid Institute for Materials Science, Austrian Academy of Science, Jahnstrasse 12, 8700 Leoben, Austria

4. Bruker AXS GmbH, Östliche Rheinbrückenstraße 49, 76187 Karlsruhe, Germany

Funder

Comet K2 Program Austria

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5005879

Reference51 articles.

1. X-ray and neutron scattering from rough surfaces

2. Growth mode, strain state and shape of Ge islands during their growth at different temperatures: a combined in situ GISAXS and GIXD study