Crystallography of SiP and SiAs Single Crystals and of SiP Precipitates in Si
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1708117
Reference17 articles.
1. X‐Ray Observations of Diffusion‐Induced Dislocations in Silicon
2. Imperfections in Silicon Induced by Diffusion of the Impurities
3. Observation of Diffusion‐Induced Dislocation Lines in Silicon through Optical Microscopy
4. Diffusion-Induced Imperfections in Silicon
5. Effect of Fast Cooling on Diffusion-Induced Imperfections in Silicon
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