Utilizing time domain electrical methods to monitor MLCCs' degradation
Author:
Affiliation:
1. Materials Research Institute, Department of Materials Science and Engineering, Center for Dielectrics and Piezoelectrics, The Pennsylvania State University , University Park, Pennsylvania 16802, USA
Abstract
Funder
Center for Dielectrics and Piezoelectrics, North Carolina State University
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
https://pubs.aip.org/aip/apl/article-pdf/doi/10.1063/5.0138806/16785167/112902_1_online.pdf
Reference47 articles.
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2. Infant Mortality, Freaks, and Wear-Out: Application of Modern Semiconductor Reliability Methods to Ceramic Multilayer Capacitors
3. Perspectives and challenges in multilayer ceramic capacitors for next generation electronics
4. Importance of uniformity of grain size to reduce dc degradation and improve reliability of ultra-thin BaTiO3-based MLCCs
5. Utilization of Multiple-Stage Sintering to Control Ni Electrode Continuity in Ultrathin Ni?BaTiO3Multilayer Capacitors
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3. Quality assessment and lifetime prediction of base metal electrode multilayer ceramic capacitors: Challenges and opportunities;Power Electronic Devices and Components;2023-10
4. Energy conversion and storage in functional dielectrics;Applied Physics Letters;2023-09-11
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