Laboratory x-ray microscopy on high brilliance sources equipped with waveguides-Reference-Cited by-同舟云学术

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Laboratory x-ray microscopy on high brilliance sources equipped with waveguides

Published:2015-07-21 Issue:3 Volume:118 Page:034904
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Fella C.¹,Balles A.¹,Zabler S.¹,Hanke R.¹,Tjeung R.²^ORCID,Nguyen S.³,Pelliccia D.³⁴⁵^ORCID

Affiliation:

1. Lehrstuhl für Roentgenmikroskopie, Universität Würzburg, 97074 Würzburg, Germany

2. Melbourne Centre for Nanofabrication, Victoria 3168, Australia

3. School of Physics and Astronomy, Monash University, Victoria 3800, Australia

4. School of Applied Sciences, RMIT University, Victoria 3001, Australia

5. Australian Synchrotron, Victoria 3168, Australia

Funder

Monash University Researcher Accelerator

Australian Research Council (ARC)

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4927038

Reference30 articles.

1. Quantitative X-ray projection microscopy: phase-contrast and multi-spectral imaging

2. Simultaneous phase and amplitude extraction from a single defocused image of a homogeneous object

3. X-ray phase-contrast microscopy and microtomography

4. Phase retrieval and differential phase-contrast imaging with low-brilliance X-ray sources

5. Hard X-Ray Phase Tomography with Low-Brilliance Sources

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