Characteristic capacitance in an electric force microscope determined by using sample surface bias effect
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2938846
Reference15 articles.
1. Time evolution studies of the electrostatic surface potential of low-temperature-grown GaAs using electrostatic force microscopy
2. Contact electrification using force microscopy
3. Charge, Polarizability, and Photoionization of Single Semiconductor Nanocrystals
4. Quantitative Noncontact Electrostatic Force Imaging of Nanocrystal Polarizability
5. Electric force microscopy of individually charged nanoparticles on conductors: An analytical model for quantitative charge imaging
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