Direct measurement of single-dot coercivity and statistical analysis of switching field distribution in bit-patterned media using scanning hard-X-ray nanoprobe-Reference-Cited by-同舟云学术

Direct measurement of single-dot coercivity and statistical analysis of switching field distribution in bit-patterned media using scanning hard-X-ray nanoprobe

Published:2016-10-14 Issue:14 Volume:120 Page:144503
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Suzuki Motohiro¹,Kondo Yuji²,Ariake Jun²^ORCID

Affiliation:

1. Japan Synchrotron Radiation Research Institute (JASRI), 1–1–1 Kouto, Sayo, Hyogo 679-5198, Japan

2. Akita Industrial Technology Center (AIT), 4–21 Sanuki, Araya, Akita 010-1623, Japan

Funder

Green IT Project of New Energy and Industrial Technology Development

JPSJ KAKENHI

The Research-Network Building Program for Reduction of Carbon Dioxide Emission

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4964810

Reference26 articles.

1. Patterned media: a viable route to 50 Gbit/in/sup 2/ and up for magnetic recording?

2. Patterned Magnetic Recording Media

3. Prospects for bit patterned media for high-density magnetic recording

4. Fabrication of 5 Tdot/in.2 bit patterned media with servo pattern using directed self-assembly

5. Recording potential of bit-patterned media

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