Simultaneous measurements of thin film thickness using total internal reflection fluorescence microscopy and disjoining pressure using Scheludko cell-Reference-Cited by-同舟云学术

Simultaneous measurements of thin film thickness using total internal reflection fluorescence microscopy and disjoining pressure using Scheludko cell

Published:2019-04 Issue:4 Volume:90 Page:045118
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Ma Tengxiao¹,Zhou Leping¹,Du Xiaoze¹,Yang Yongping¹

Affiliation:

1. Key Laboratory of Condition Monitoring and Control for Power Plant Equipment of Ministry of Education, School of Energy, Power and Mechanical Engineering, North China Electric Power University, Beijing 102206, China

Funder

National Natural Science Foundation of China

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5058218

Reference40 articles.

1. Characteristics of an evaporating thin film in a microchannel

2. Contact line deposits in an evaporating drop

3. The interline heat-transfer coefficient of an evaporating wetting film

4. Investigation of an Evaporating Extended Meniscus Based on the Augmented Young–Laplace Equation

5. On the question of determining the concept of disjoining pressure and its role in the equilibrium and flow of thin films

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