Effects of strain on thermal conductivity of silicon dioxide thin films using test method based on 3-ω technique and uniaxial strain setup-Reference-Cited by-同舟云学术

Effects of strain on thermal conductivity of silicon dioxide thin films using test method based on 3-ω technique and uniaxial strain setup

Author:

Li Zhibin¹²^ORCID,Wang Hairong¹²^ORCID,Zhao Huiying¹²,Gu Hanqing¹²,Wang Jiuhong¹²,Wei Xueyong¹²^ORCID

Affiliation:

1. School of Mechanical Engineering, Xi’an Jiaotong University, Xi’an, Shanxi 710049, China

2. State Key Laboratory for Manufacturing Systems Engineering, Xi’an Jiaotong University, Xi’an, Shanxi 710049, China

Funder

Science Challenge Project of China

National Science and Technology Major Project of China

111 Program

Foundation for Innovative Research Groups of the National Natural Science Foundation of China

Publisher

AIP Publishing

Subject

Instrumentation

Link

Reference40 articles.

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