Degradation mechanisms in organic light-emitting devices: Metal migration model versus unstable tris(8-hydroxyquinoline) aluminum cationic model
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2435070
Reference17 articles.
1. Reliability and degradation of organic light emitting devices
2. Formation and growth of black spots in organic light‐emitting diodes
3. Investigation of the sites of dark spots in organic light-emitting devices
4. Degradation Mechanism of Small Molecule-Based Organic Light-Emitting Devices
5. Simultaneous electroluminescence and photoluminescence aging studies of tris(8-hydroxyquinoline) aluminum-based organic light-emitting devices
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