High throughput on-chip analysis of high-energy charged particle tracks using lensfree imaging-Reference-Cited by-同舟云学术

High throughput on-chip analysis of high-energy charged particle tracks using lensfree imaging

Published:2015-04-13 Issue:15 Volume:106 Page:151107
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Luo Wei¹,Shabbir Faizan¹,Gong Chao¹,Gulec Cagatay¹^ORCID,Pigeon Jeremy¹,Shaw Jessica¹^ORCID,Greenbaum Alon¹,Tochitsky Sergei¹,Joshi Chandrashekhar¹,Ozcan Aydogan¹²³

Affiliation:

1. Electrical Engineering Department, University of California, Los Angeles, California 90095, USA

2. Bioengineering Department, University of California, Los Angeles, California 90095, USA

3. California NanoSystems Institute (CNSI), University of California, Los Angeles, California 90095, USA

Funder

National Science Foundation (NSF)

Office of Naval Research (ONR)

Howard Hughes Medical Institute (HHMI)

Army Research Office (ARO)

U.S. Department of Energy (Department of Energy)

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/am-pdf/10.1063/1.4918741

Reference29 articles.

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4. D3He-proton emission imaging for inertial-confinement-fusion experiments (invited)

5. Review of Particle Physics

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