Coulomb electron drag mechanism of terahertz plasma instability in n+-i-n-n+ graphene FETs with ballistic injection-Reference-Cited by-同舟云学术

Coulomb electron drag mechanism of terahertz plasma instability in n+-i-n-n+ graphene FETs with ballistic injection

Author:

Ryzhii V.¹²^ORCID,Ryzhii M.³^ORCID,Mitin V.⁴^ORCID,Shur M. S.⁵^ORCID,Otsuji T.¹^ORCID

Affiliation:

1. Research Institute of Electrical Communication, Tohoku University, Sendai 980-8577, Japan

2. Institute of Ultra High Frequency Semiconductor Electronics of RAS, Moscow 117105, Russia

3. Department of Computer Science and Engineering, University of Aizu, Aizu-Wakamatsu 965-8580, Japan

4. Department of Electrical Engineering, University at Buffalo, SUNY, Buffalo, New York 14260, USA

5. Department of Electrical, Computer, and Systems Engineering, Rensselaer Polytechnic Institute, Troy, New York 12180, USA

Funder

Japan Society for Promotion of Science, Research Institute of Electrical Communication,

Japan Society for Promotion of Science,

Research Institute of Electrical Communication, Tohoku University

Office of Naval Research

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

Reference36 articles.

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