Secondary electron emission spectroscopy: A sensitive and novel method for the characterization of the near‐surface region of diamond and diamond films-Reference-Cited by-同舟云学术

Secondary electron emission spectroscopy: A sensitive and novel method for the characterization of the near‐surface region of diamond and diamond films

Published:1991-01-28 Issue:4 Volume:58 Page:361-363
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Hoffman Alon,Prawer Steven,Folman Mordechai

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.104634

Reference13 articles.

1. Secondary-electron emission spectroscopy and the observation of high-energy excited states in graphite: Theory and experiment

2. High-energy angle-resolved secondary-electron emission spectroscopy of highly oriented pyrolytic graphite

3. Angle-resolved secondary electron investigation of graphite: A band mapping

4. Angle-resolved photoemission and secondary electron emission from single-crystal graphite

5. Effect of low energy argon ion irradiation on the secondary electron emission spectrum of highly oriented pyrolytic graphite

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