Growth and crystal structure of CdTe1−xSex (x ≥ 0.75) thin films prepared by the method of high-frequency magnetron sputtering

Abstract

CdTe1–xSex (x = 0.75 and 0.95) thin films were deposited on quartz substrate by the method of high-frequency magnetron sputtering. The chemical composition analysis and crystal structure refinement was examined with using X-ray fluorescence spectroscopy and X-ray diffraction data. CdTe1–xSex thin films crystallizes in hexagonal structure [structure type—ZnO, space group P63mc (No. 186)]. Unit cell parameters decrease with increasing Se content in CdTe1–xSex thin films. The value of the optical band gap for CdTe0.25Se0.75 and CdTe0.05Se0.95 was estimating using the Tauc plot and from the maximum position of the first derivative of the transmittance dT/dλ.