Contact stiffness of finite size subsurface defects for atomic force microscopy: Three-dimensional finite element modeling and experimental verification-Reference-Cited by-同舟云学术

Contact stiffness of finite size subsurface defects for atomic force microscopy: Three-dimensional finite element modeling and experimental verification

Published:2008-06 Issue:11 Volume:103 Page:114910
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Parlak Zehra,Levent Degertekin F.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.2936881

Reference30 articles.

1. Atomic Force Microscope

2. AFM and Acoustics: Fast, Quantitative Nanomechanical Mapping

3. Quantitative Elastic-Property Measurements at the Nanoscale with Atomic Force Acoustic Microscopy

4. Vibrations of free and surface‐coupled atomic force microscope cantilevers: Theory and experiment

5. Imaging and measurement of local mechanical material properties by atomic force acoustic microscopy

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