Characterization of magnetic tunnel junction test pads-Reference-Cited by-同舟云学术

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Characterization of magnetic tunnel junction test pads

Published:2015-10-14 Issue:14 Volume:118 Page:143901
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Østerberg Frederik Westergaard¹^ORCID,Kjær Daniel¹²,Nielsen Peter Folmer²,Hansen Ole¹³^ORCID,Petersen Dirch Hjorth¹

Affiliation:

1. Department of Micro- and Nanotechnology, Technical University of Denmark, DTU Nanotech, Building 345 East, DK-2800 Kongens Lyngby, Denmark

2. CAPRES A/S, Scion-DTU, Building 373, DK-2800 Kongens Lyngby, Denmark

3. CINF—Centre for Individual Nanoparticle Functionality, Technical University of Denmark, Building 345 East, DK-2800 Kongens Lyngby, Denmark

Funder

Innovation Fund Denmark

Villum Fonden (Villum Foundation)

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4932663

Reference22 articles.

1. Tunneling between ferromagnetic films

2. Tuning of MgO barrier magnetic tunnel junction bias current for picotesla magnetic field detection

3. Spin tunneling heads above 20 Gb/in/sup 2/

4. Magnetic tunnel junctions

5. A performance study of next generation's TMR heads beyond 200 gb/in/sup 2/

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1. Towards diamond micro four-point probes;Micro and Nano Engineering;2019-12

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