Semiconductor conductivity measurements using a high‐sensitivity microwave technique
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1663631
Reference13 articles.
1. Interferometric Effect with Semiconductors in the Millimeter-Wave Region
2. Scanning the issue
3. Electrodeless Determination of Semiconductor Conductivity from TE01°‐Mode Reflectivity
4. Techniques for the Measurement of Complex Microwave Conductivity and the Associated Errors
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1. Enhanced responsivity resonant RF photodetectors;Optics Express;2016-11-01
2. A microwave method for electrical measurements of semiconductors: theory and measurements;Semiconductor Science and Technology;2000-02-01
3. Microwave conductivity studies on some semiconductors;Pramana;1995-01
4. Conductivity and mobility contactless measurements of semiconducting layers by microwave absorption at 35 GHz;Journal de Physique III;1994-04
5. Caractérisation d'un substrat semiconducteur par technique micro-onde et injection photonique;Revue de Physique Appliquée;1978
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