Short and long annealing of high‐dose arsenic‐implanted pseudomorphic GexSi1−xon Si(100)

Author:

Lie D. Y. C.,Im S.,Nicolet M.‐A.,Theodore N. D.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Si/SiGe heterostructures for Si-based nanoelectronics;Handbook of Advanced Electronic and Photonic Materials and Devices;2001

2. Chapter 4 SiGe/Si processing;Processing and Properties of Compound Semiconductors;2001

3. Enhanced strain relaxation of epitaxial SiGe layers on Si(100) after H+ ion implantation;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-01

4. Defects formed during 1 MeV Si ion-irradiation of GeSi/Si strained-layer heterostructures at elevated temperatures;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-01

5. Doping and processing epitaxial GexSi1−x films on Si(100) by ion implantation for Si-based heterojunction devices applications;Journal of Electronic Materials;1998-05

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