Structural modification of nanocrystalline diamond films via positive/negative bias enhanced nucleation and growth processes for improving their electron field emission properties-Reference-Cited by-同舟云学术

Structural modification of nanocrystalline diamond films via positive/negative bias enhanced nucleation and growth processes for improving their electron field emission properties

Published:2015-06-07 Issue:21 Volume:117 Page:215307
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Saravanan A.,Huang B. R.,Sankaran K. J.,Keiser G.,Kurian J.^ORCID,Tai N. H.,Lin I. N.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4921875

Reference47 articles.

1. Field emission of individual carbon nanotube within situtip image and real work function

2. Field electron emission characteristics of diamond films with different grain morphologies

3. Low-threshold cold cathodes made of nitrogen-doped chemical-vapour-deposited diamond

4. Field emission properties of nitrogen-doped diamond films

5. Diamond cold cathode

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Negative bias effects on deposition and mechanical properties of ultrananocrystalline diamond/amorphous carbon composite films deposited on cemented carbide substrates by coaxial arc plasma;Diamond and Related Materials;2019-06

2. Nitrogen Incorporated (Ultra)Nanocrystalline Diamond Films for Field Electron Emission Applications;Topics in Applied Physics;2019

3. Phase transitions and critical phenomena of tiny grains carbon films synthesized in microwave-based vapor deposition system;Surface and Interface Analysis;2018-11-28

4. Effects of metallic interlayers on the performance of nanocrystalline diamond metal-semiconductor-metal photodetectors;Applied Surface Science;2018-10

5. Diamond film deposition on WC–Co and steel substrates with a CrN interlayer for tribological applications;Journal of Physics D: Applied Physics;2016-04-26