Improved spatial resolution for reflection mode infrared microscopy
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3270260
Reference13 articles.
1. Fourier transform infrared microscopical analysis with synchrotron radiation: The microscope optics and system performance (invited)
2. Performance of an infrared microspectrometer at the NSLS
3. The First Synchrotron Infrared Beamlines at the Advanced Light Source: Microscpectroscopy and Fast Timing
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