Highly localized strain fields due to planar defects in epitaxial SrBi2Nb2O9 thin films
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1870119
Reference51 articles.
1. Fatigue-free ferroelectric capacitors with platinum electrodes
2. X-Ray diffraction line broadening by stacking faults in SrBi2Nb2O9/SrTiO3 epitaxial thin films
3. High-resolution transmission electron microscopy study on the solid-phase crystallization of amorphous SrBi2Ta2O9 thin films on Si
4. High-resolution electron microscopy investigations on stacking faults in SrBi2Ta2O9 ferroelectric thin films
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