Semi-classical noise investigation for sub-40nm metal-oxide-semiconductor field-effect transistors
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://scitation.aip.org/deliver/fulltext/aip/journal/adva/5/8/1.4928424.pdf?itemId=/content/aip/journal/adva/5/8/10.1063/1.4928424&mimeType=pdf&containerItemId=content/aip/journal/adva
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1. Experimental Investigation of Quasi-Ballistic Carrier Transport Characteristics in 10-nm Scale MOSFETs
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3. Compact Noise Models for MOSFETs
4. Shot noise in mesoscopic conductors
5. Transit-Time Effects in the Noise of Schottky-Barrier Diodes
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