Concurrent x-ray diffractometer for high throughput structural diagnosis of epitaxial thin films-Reference-Cited by-同舟云学术

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Concurrent x-ray diffractometer for high throughput structural diagnosis of epitaxial thin films

Published:2001-11-26 Issue:22 Volume:79 Page:3594-3596
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Ohtani M.,Fukumura T.,Kawasaki M.,Omote K.,Kikuchi T.,Harada J.,Ohtomo A.,Lippmaa M.,Ohnishi T.,Komiyama D.,Takahashi R.,Matsumoto Y.,Koinuma H.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1415402

Reference9 articles.

1. A Combinatorial Approach to Materials Discovery

2. Combinatorial Laser Molecular Beam Epitaxy (MBE) Growth of Mg-Zn-O Alloy for Band Gap Engineering

3. Combinatorial synthesis and high throughput evaluation of ferroelectric/dielectric thin-film libraries for microwave applications

4. Room-Temperature Ferromagnetism in Transparent Transition Metal-Doped Titanium Dioxide

5. Rapid construction of a phase diagram of doped Mott insulators with a composition-spread approach

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