Accurate formulas for interaction force and energy in frequency modulation force spectroscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1667267
Reference10 articles.
1. Direct mechanical measurement of interatomic potentials
2. Direct measurement of interatomic force gradients using an ultra-low-amplitude atomic force microscope
3. Measuring the nanomechanical properties and surface forces of materials using an atomic force microscope
4. Frequency modulation detection using high‐Qcantilevers for enhanced force microscope sensitivity
5. Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy
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