In situ SFG spectroscopy of film growth. I. General formulation and the analysis of the signal observed during the deposition of formic acid on Pt(110)-(1×2) surface-Reference-Cited by-同舟云学术

In situ SFG spectroscopy of film growth. I. General formulation and the analysis of the signal observed during the deposition of formic acid on Pt(110)-(1×2) surface

Published:1998-04-08 Issue:14 Volume:108 Page:5948-5956
ISSN:0021-9606
Container-title:The Journal of Chemical Physics
language:en
Short-container-title:The Journal of Chemical Physics

Author:

Hirose Chiaki,Ishida Hirokazu,Iwatsu Katsuhiko,Watanabe Nobuyuku,Kubota Jun,Wada Akihide,Domen Kazunari

Publisher

AIP Publishing

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.476006

Reference15 articles.

1. Surface properties probed by second-harmonic and sum-frequency generation

2. Sum-frequency vibrational spectroscopy of the solid/liquid interface

3. Sum-frequency vibrational spectroscopy of a Langmuir film: Study of molecular orientation of a two-dimensional system

4. Orientation analysis by simulation of vibrational sum frequency generation spectrum: CH stretching bands of the methyl group

5. Formulas for the Analysis of the Surface SFG Spectrum and Transformation Coefficients of Cartesian SFG Tensor Components

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