Note: Radiofrequency scanning probe microscopy using vertically oriented cantilevers-Reference-Cited by-同舟云学术

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Note: Radiofrequency scanning probe microscopy using vertically oriented cantilevers

Published:2012-12 Issue:12 Volume:83 Page:126103
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Valdrè G.,Moro D.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4772399

Reference14 articles.

1. High-frequency near-field microscopy

2. Principles of Near-Field Microwave Microscopy

3. Quantitative Measurement of Linear Dielectric Constant Using Scanning Nonlinear Dielectric Microscopy with Electro-Conductive Cantilever

4. Localized picosecond resolution with a near-field microwave/scanning-force microscope

5. Design and Fabrication of Scanning Near-Field Microwave Probes Compatible With Atomic Force Microscopy to Image Embedded Nanostructures

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Scanning probe – atomic force microscopy: new developments and applications;IOP Conference Series: Materials Science and Engineering;2014-03-05

2. Radiofrequency impedance variation of characterized tip–sample nanocontacts in shear force microscopy with vertically oriented cantilevers connected to a vector network analyser;Measurement Science and Technology;2013-07-26

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