Direct observation of stacking fault tetrahedra in ZnSe/GaAs(001) pseudomorphic epilayers by weak beam dark-field transmission electron microscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.119858
Reference11 articles.
1. Role of stacking faults as misfit dislocation sources and nonradiative recombination centers in II‐VI heterostructures and devices
2. Dislocation nucleation mechanism in nitrogen-doped ZnSe/GaAs
3. Degradation of II‐VI based blue‐green light emitters
4. Degradation of II‐VI based blue‐green light emitters
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