Analytical inversion of photothermal measurements: Independent determination of the thermal conductivity and diffusivity of a conductive layer deposited on an insulating substrate-Reference-Cited by-同舟云学术

Analytical inversion of photothermal measurements: Independent determination of the thermal conductivity and diffusivity of a conductive layer deposited on an insulating substrate

Published:2007-12 Issue:11 Volume:102 Page:116104
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Frétigny Christian,Roger Jean Paul,Reita Valérie,Fournier Danièle

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.2818102

Reference13 articles.

1. Thermal conductivity of thin metallic films measured by photothermal profile analysis

2. Thermal conductivities of evaporated gold films on silicon and glass

3. Thermal Conductivity of Yttria-Zirconia Single Crystals, Determined with Spatially Resolved Infrared Thermography

4. Measuring the anisotropic thermal diffusivity of silicon nitride grains by thermoreflectance microscopy

5. Complete thermal characterization of film-on-substrate system by modulated thermoreflectance microscopy and multiparameter fitting

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