Generalized analysis of quasi-steady-state and transient decay open circuit voltage measurements-Reference-Cited by-同舟云学术

Generalized analysis of quasi-steady-state and transient decay open circuit voltage measurements

Published:2002 Issue:1 Volume:91 Page:399
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:J. Appl. Phys.

Author:

Kerr Mark J.,Cuevas Andres,Sinton Ronald A.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Reference9 articles.

1. Contactless determination of current–voltage characteristics and minority‐carrier lifetimes in semiconductors from quasi‐steady‐state photoconductance data

2. Prediction of the open-circuit voltage of solar cells from the steady-state photoconductance

3. Recombination and trapping in multicrystalline silicon

4. R. A. Sinton and A. Cuevas, inA Quasi-Steady-State Open-Circuit Voltage Method for Solar Cell Characterization, Proceedings of the 16th European Photovoltaic Solar Energy Conference, Glasgow, Scotland, 2000, pp. 1152–1155.

5. Reduced fill factors in multicrystalline silicon solar cells due to injection-level dependent bulk recombination lifetimes

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