Electroreflectance, photoreflectance, and photoabsorption properties of polycrystalline CdTe thin films prepared by the gradient recrystallization and growth technique-Reference-Cited by-同舟云学术

Electroreflectance, photoreflectance, and photoabsorption properties of polycrystalline CdTe thin films prepared by the gradient recrystallization and growth technique

Published:1985-09 Issue:5 Volume:58 Page:2066-2069
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Vázquez‐López C.,Navarro H.,Aceves Raúl,Vargas M. C.,Menezes Cornelius A.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.335965

Reference8 articles.

1. Sputtered indium-tin oxide/cadmium telluride junctions and cadmium telluride surfaces

2. Preparation of low resistivity CdTe films by a multi-source evaporation method

3. Third-derivative modulation spectroscopy with low-field electroreflectance

4. The Use of Close Spacing in Chemical-Transport Systems for Growing Epitaxial Layers of Semiconductors

5. GREG: A New Hotwall‐Close‐Spaced Vapor Transport Deposition System

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