Measurement of high-energy (10–60 keV) x-ray spectral line widths with eV accuracy-Reference-Cited by-同舟云学术

Measurement of high-energy (10–60 keV) x-ray spectral line widths with eV accuracy

Published:2014-11 Issue:11 Volume:85 Page:11D618
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Seely J. F.,Glover J. L.,Hudson L. T.,Ralchenko Y.,Henins Albert,Pereira N.,Feldman U.,Di Stefano C. A.,Kuranz C. C.,Drake R. P.,Chen Hui,Williams G. J.,Park J.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4891726

Reference4 articles.

1. Measurement of the O2O3O4 and O3O4O5 super Coster–Kronig rates in tungsten via asymmetric diffraction spectrometry

2. Enhanced x-ray resolving power achieved behind the focal circles of Cauchois spectrometers

3. Energetic electron propagation in solid targets driven by the intense electric fields of femtosecond laser pulses

4. WIDTHS OF THE ATOMIC K–N7 LEVELS

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