Submicrometer resolution far field high sensitivity Kerr microscopy for in-plane magnetization detection-Reference-Cited by-同舟云学术

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Submicrometer resolution far field high sensitivity Kerr microscopy for in-plane magnetization detection

Published:2009-07 Issue:7 Volume:80 Page:073107
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Wang C. H.,Yang Z.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.3183496

Reference29 articles.

1. Atomic Force Microscope

2. Methods of observing magnetic domains by scanning electron microscopy

3. Magnetic contrast in the scanning electron microscope: An appraisal of techniques and their applications

4. Magnetic Domain Observations by Electron Microscopy

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3. Reflectance difference spectroscopy microscope for circular defects on InN films;Optics Express;2016-06-24

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