Charging of dielectrics under focused ion beam irradiation
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2895194
Reference25 articles.
1. Engineering of nanostructured carbon materials with electron or ion beams
2. Electrical characterization of charges in irradiated oxides by electrostatic force microscopy and Kelvin method
3. Microscopy of Semiconducting Materials;Stevens M. A.,2003
4. Ion-induced electron emission as a means of studying energy- and angle-dependent compositional changes of solids bombarded with reactive ions
5. Extended defects in Si wafers implanted with ions of rare-earth elements
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1. Rewritable printing of ionic liquid nanofilm utilizing focused ion beam induced film wetting;Nature Communications;2024-04-05
2. Method for Measuring the Dielectrics Charging Potential under Ion Irradiation Using Shifting the Bremsstrahlung Edge;Technical Physics;2024-01
3. Modulation Effect of Substrate Interactions on Nucleation and Growth of MoS2 on Silica;The Journal of Physical Chemistry C;2023-05-09
4. Differences in the Kinetic Characteristics of Charging Ferroelectrics and Dielectrics upon Ion Irradiation;Bulletin of the Russian Academy of Sciences: Physics;2021-08
5. Forward domain growth on the non-polar cut of lithium niobate crystal during irradiation by focused ion beam;Ferroelectrics;2021-04-04
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