A high resolution photoionization study of Ne and Ar: Observation of mass analyzed threshold ions using synchrotron radiation and direct current electric fields-Reference-Cited by-同舟云学术

A high resolution photoionization study of Ne and Ar: Observation of mass analyzed threshold ions using synchrotron radiation and direct current electric fields

Published:1996-09-08 Issue:10 Volume:105 Page:3950-3961
ISSN:0021-9606
Container-title:The Journal of Chemical Physics
language:en
Short-container-title:The Journal of Chemical Physics

Author:

Hsu C.‐W.,Lu K. T.,Evans M.,Chen Y. J.,Ng C. Y.,Heimann P.

Publisher

AIP Publishing

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.472268

Reference47 articles.

1. Diffusion in copper and copper alloys part V. diffusion in systems involving elements of group VA

2. Measurement of Threshold Electrons in the Photoionization of Ar, Kr, and Xe

3. Photoionization resonance spectra I. nitric oxide and benzene

4. Photoionization resonance studies with a steradiancy analyzer. II. The photoionization of CH3I

5. Threshold Photoelectron Detector for Use in the Vacuum Ultraviolet

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