Step‐edge fabrication of ultrasmall Josephson microbridges-Reference-Cited by-同舟云学术

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Step‐edge fabrication of ultrasmall Josephson microbridges

Published:1980-02 Issue:3 Volume:36 Page:226-228
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Feuer M. D.,Prober D. E.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.91434

Reference18 articles.

1. See AIP Conf. Proc.44(1978), for a recent review of Josephson‐effect device applications.APCPCS0094-243X

2. Characterization of niobium point contacts showing Josephson effects in the far infrared

3. Josephson junctions at 45 times the energy‐gap frequency

4. Heating effects in high‐frequency metallic Josephson devices: Voltage limit, bolometric mixing, and noise

5. Heating effects in high‐frequency metallic Josephson devices: Voltage limit, bolometric mixing, and noise

Cited by 18 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Fabrication techniques for nanometer scale resistors: A poor man’s nanolithography;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;1990-09

2. Properties of step-edge Pb-Si-Pb Josephson junctions;Journal of Low Temperature Physics;1986-04

3. A Novel Design of Submicron Thin Film Point Contacts;Advances in Cryogenic Engineering Materials;1986

4. Thin-film edge-aligned junctions for small-area surface studies;Applications of Surface Science;1985-05

5. Artificially-Structured Superconductors;Percolation, Localization, and Superconductivity;1984

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