Measuring the three-photon self-annihilation fraction of positronium in and above thin films: A tool for determining film morphology
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Published:2013-10
Issue:10
Volume:84
Page:103908
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ISSN:0034-6748
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Container-title:Review of Scientific Instruments
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language:en
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Short-container-title:Review of Scientific Instruments
Author:
Townrow S.,Coleman P. G.
Cited by
4 articles.
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