Ferroelectric fatigue endurance of Bi4−xLaxTi3O12 thin films explained in terms of x-ray photoelectron spectroscopy
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2719013
Reference21 articles.
1. Layered Perovskites with Giant Spontaneous Polarizations for Nonvolatile Memories
2. Lanthanum-substituted bismuth titanate for use in non-volatile memories
3. X-ray photoemission spectroscopy characterization of the electrode-ferroelectric interfaces inPt/Bi4Ti3O12/PtandPt/Bi3.25La0.75Ti3O12/Ptcapacitors: Possible influence of defect structure on fatigue properties
4. Structure dependence of ferroelectric properties of bismuth layer-structured ferroelectric single crystals
5. Electrical anisotropy and a plausible explanation for dielectric anomaly of Bi4Ti3O12 single crystal
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