Photocurrent microscopy of contact resistance and charge carrier traps in organic field-effect transistors
Author:
Affiliation:
1. Fakultät für Physik and Center for NanoScience (CeNS), Ludwig-Maximilians-Universität München, Geschwister-Scholl-Platz 1, 80539 Munich, Germany
2. Nanosystems Initiative Munich, Schellingstrasse 4, 80799 Munich, Germany
Funder
Deutsche Forschungsgemeinschaft (DFG)
Bayerisches Staatsministerium für Bildung und Kultus, Wissenschaft und Kunst (Bavarian State Ministry of Education, Science and the Arts)
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4960159
Reference28 articles.
1. Surface potential profiling and contact resistance measurements on operating pentacene thin-film transistors by Kelvin probe force microscopy
2. Trapped charge mapping in crystalline organic transistors by using scanning Kelvin probe force microscopy
3. Spatial control of the recombination zone in an ambipolar light-emitting organic transistor
4. In situ STXM investigations of pentacene-based OFETs during operation
5. Sub-micron phase coexistence in small-molecule organic thin films revealed by infrared nano-imaging
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