Observation of two-level defect system in amorphous Se superlattices-Reference-Cited by-同舟云学术

Observation of two-level defect system in amorphous Se superlattices

Published:2020-05-11 Issue:19 Volume:116 Page:192104
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

John Joshua D.¹^ORCID,Okano Shun²^ORCID,Sharma Apoorva²^ORCID,Rahaman Mahfujur²,Selyshchev Oleksandr²,Miyachi Noritoshi¹,Enomoto Kunitaka¹,Ochiai Jun¹,Saito Ichitaro¹^ORCID,Salvan Georgeta²^ORCID,Masuzawa Tomoaki³^ORCID,Yamada Takatoshi⁴^ORCID,Chua Daniel H. C.⁵,Zahn Dietrich R. T.²^ORCID,Okano Ken¹^ORCID

Affiliation:

1. Department of Physics, International Christian University (ICU), 3-10-2 Osawa, Mitaka, Tokyo 181-8585, Japan

2. Semiconductor Physics, Chemnitz University of Technology, D-09107 Chemnitz, Germany

3. Research Institute of Electronics, Shizuoka University, 3-5-1 Johoku, Naka-ku, Hamamatsu 432-8011, Japan

4. Nanomaterials Research Institute, National Institute of Advanced Industrial Science and Technology, 1-1-1 Higashi, Tsukuba 305-8565, Japan

5. Department of Material Science and Engineering, National University of Singapore (NUS), 9 Engineering Drive, Singapore 119077

Funder

Cooperative Research Project of the Research Center for Biomedical Engineering

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/5.0004570

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5. K. Tanioka , in Proceedings of 2001 IEEE Workshop CCD and Advanced Image Sensors ( IEEE, 2001), pp. 216–219.

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