Air-stable solution-processed n-channel organic thin film transistors with polymer-enhanced morphology-Reference-Cited by-同舟云学术

Air-stable solution-processed n-channel organic thin film transistors with polymer-enhanced morphology

Published:2015-05-04 Issue:18 Volume:106 Page:183301
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

He Zhengran¹,Shaik Shoieb¹,Bi Sheng¹,Chen Jihua²,Li Dawen¹

Affiliation:

1. Department of Electrical and Computer Engineering, Center for Materials for Information Technology, The University of Alabama, Tuscaloosa, Alabama 35487, USA

2. Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA

Funder

National Science Foundation (NSF)

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4919677

Reference24 articles.

1. General observation of n-type field-effect behaviour in organic semiconductors

2. Solution-based 5,6,11,12-tetrachlorotetracene crystal growth for high-performance organic thin film transistors

3. Solution-processed ambipolar organic field-effect transistors and inverters

4. Air-flow navigated crystal growth for TIPS pentacene-based organic thin-film transistors

5. Band-like temperature dependence of mobility in a solution-processed organic semiconductor

Cited by 43 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Hybrid System of Polystyrene and Semiconductor for Organic Electronic Applications;Processes;2024-09-10

2. A Green Binary Solvent Method to Control Organic Semiconductor Crystallization;ChemistrySelect;2023-01-04

3. Binary solvent engineering for small-molecular organic semiconductor crystallization;Materials Advances;2023

4. The Electrical Characteristics and the Interface State Densities of Al/p-Si Structures with and Without the GO Insulator Layer;Current Chinese Science;2022-12

5. Solvent Exchange in Controlling Semiconductor Morphology;Electronic Materials Letters;2022-10-27