Highly conductive diamond probes for scanning spreading resistance microscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.126109
Reference11 articles.
1. Cross-sectional nano-spreading resistance profiling
2. Two-dimensional carrier profiling of InP structures using scanning spreading resistance microscopy
3. CVD diamond probes for nanotechnology
4. Fabrication of integrated diamond cantilevers with tips for SPM applications
5. Diamond tips and cantilevers for the characterization of semiconductor devices
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