A contrast in the electronic structures of B ion implanted ZnO thin films grown on glass and silicon substrates by using x-ray absorption spectroscopy

Author:

Kumar Krishna1ORCID,Wu Shi-Chen2,Yu Yueh-Chung2,Wei Da-Hua3,Chiou Jau-Wern45ORCID

Affiliation:

1. Department of General Studies, Physics Division, Jubail Industrial College, Jubail Industrial City 31961, Kingdom of Saudi Arabia

2. Institute of Physics, Academia Sinica, Taipei 115, Taiwan

3. Institute of Mechatronic Engineering, National Taipei University of Technology, Taipei 106, Taiwan

4. Department of Applied Physics, National University of Kaohsiung, Kaohsiung 811, Taiwan

5. Department of Physics, National Sun Yat-sen University, Kaohsiung 804, Taiwan

Funder

Ministry of Science and Technology, Taiwan

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Ion beam engineering of implanted ZnO thin films for solar cell and lighting applications;Chemical Engineering Journal Advances;2023-08

2. Magnetism in zinc oxide (ZnO);Defect-Induced Magnetism in Oxide Semiconductors;2023

3. Growth of β-NaGaO2 thin films using ultrasonic spray pyrolysis;Journal of Asian Ceramic Societies;2022-04-03

4. Defect Driven Magnetic Properties of Oxide Materials;SpringerBriefs in Physics;2022

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